Cosmic and terrestrial single-event radiation effects in dynamic random access memories

This publication has 79 references indexed in Scilit:

• Heavy Ton / Proton Test Results On High Integrated Memories
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Radiation testing of flight lots for MARS-94 covering-semiconductor types as 4 M-BIT DRAM, 256 K-BIT SRAM, 256 K-BIT EEPROM and a 53C90 SCSI controller
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Heavy ion, proton and Co-60 radiation evaluation of 16 Mbit DRAM memories for space application
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A new class of single event hard errors [DRAM cells]
  IEEE Transactions on Nuclear Science, 1994
• Space radiation evaluation of 16 Mbit DRAMs for mass memory applications
  IEEE Transactions on Nuclear Science, 1994
• Total dose failures in advanced electronics from single ions
  IEEE Transactions on Nuclear Science, 1993
• Alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on VLSI memories
  IEEE Transactions on Electron Devices, 1985
• An n-well CMOS dynamic RAM
  IEEE Transactions on Electron Devices, 1982
• The use of thin epitaxial silicon layers for MOS VLSI
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1981
• Soft Errors in VLSI: Present and Future
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1979