Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations
- 1 December 2001
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 90 (11) , 5483-5486
- https://doi.org/10.1063/1.1408261
Abstract
The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures.This publication has 7 references indexed in Scilit:
- Experimental Verification of a Negative Index of RefractionScience, 2001
- Negative Refraction Makes a Perfect LensPhysical Review Letters, 2000
- Negative Refractive Index in Left-Handed MaterialsPhysical Review Letters, 2000
- Composite Medium with Simultaneously Negative Permeability and PermittivityPhysical Review Letters, 2000
- Magnetism from conductors and enhanced nonlinear phenomenaIEEE Transactions on Microwave Theory and Techniques, 1999
- Extremely Low Frequency Plasmons in Metallic MesostructuresPhysical Review Letters, 1996
- THE ELECTRODYNAMICS OF SUBSTANCES WITH SIMULTANEOUSLY NEGATIVE VALUES OF $\epsilon$ AND μSoviet Physics Uspekhi, 1968