Annealing Study of Bi-Sr-Ca-Cu-O Superconducting Thin Film

Abstract
We studied the postannealing conditions needed to make the 110 K phase in Bi-Sr-Ca-Cu-O superconducting thin film deposited on (001) single-crystal MgO substrates by rf magnetron sputtering. We used X-ray diffraction to estimate the amount of 110 K phase in the film. We found that the film included a large 110 K phase at about 840°C in 7–8% oxygen/helium flow and that high-speed cooling can suppress the 80 K phase formation. By comparing films made with different cooling rates, we conclude that the tail of the temperature dependence curve of the electrical resistance does not depend on the other superconducting phases whose c-axes are perpendicular to the sbstrate surface.

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