Etching Studies on Singly and Doubly Rotated Quartz Plates

• 1 January 1979
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 351-358
• https://doi.org/10.1109/freq.1979.200338

Abstract

Keywords

• ETCHING
• CHEMICALS
• ROUGH SURFACES
• SURFACE ROUGHNESS
• SURFACE MORPHOLOGY
• SURFACE TOPOGRAPHY
• SCANNING ELECTRON MICROSCOPY
• FREQUENCY
• HAFNIUM
• LABORATORIES