Microwave Scanning Microscopy for Non-Destructive Testing
- 1 September 1975
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 213-217
- https://doi.org/10.1109/euma.1975.332181
Abstract
A microwave scanning microscope capable of detecting and locating defects in a metal surface is described. Using a technique to obtain super-resolution, previously described, the instrument has proved capable of resolving gratings with periods of λ/200, and of detecting fatigue cracks less than 2μ in width.Keywords
This publication has 1 reference indexed in Scilit:
- A Novel Nondestructive, Noncontacting Method of Measuring the Depth of Thin Slits and Cracks in MetalsReview of Scientific Instruments, 1970