Rapid surface topography using a tapping mode atomic force microscope
- 12 April 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 74 (15) , 2149-2151
- https://doi.org/10.1063/1.123783
Abstract
No abstract availableKeywords
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- High-speed, large-scale imaging with the atomic force microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991