Ion scattering spectrometry: A versatile technique for a variety of materials
- 1 December 1981
- journal article
- review article
- Published by Wiley in Surface and Interface Analysis
- Vol. 3 (6) , 243-250
- https://doi.org/10.1002/sia.740030604
Abstract
The extraordinary surface sensitivity of low energy ion scattering spectrometry may be applied to the characterization of a wide variety of materials. On the one hand, the surface chemistry may be determined, using ion scattering spectrometry for engineering materials used in diverse technologies such as lubrication and adhesive bonding; such surface chemistry, perhaps involving only a few monolayers, may govern the success or failure of a process. On the other hand, ion scattering spectrometry is also useful in investigating the chemistry and physical and electronic structure of single crystals. The presence of fine features in the spectra enable shadowing and selective neutralization effects to be observed. Striking spectral features are seen in III–V, II–VI, and I–VII compounds. Scattered ion yield curves show a potential for the use of ion scattering spectrometry to determine bonding and electronic structure in some elements. In addition, conventional scattering experiments may be used to determine subtle elemental changes on crystal faces having different orientations. Adsorption‐desorption characteristics of different orientations may also be studied in conjunction with the complementary secondary ion mass spectrometry technique.Keywords
This publication has 36 references indexed in Scilit:
- Scattering of Low-Energy Ions from Clean Surfaces: Comparison of Alkali- and Rare-Gas-Ion ScatteringPhysical Review Letters, 1980
- 4He+ ion scattering spectrometry of AlF3, MgF2, NaF and NaCl below 5.0 keVApplications of Surface Science, 1980
- Characterization of tungsten impregnated dispenser cathodes using ISS and SIMSApplications of Surface Science, 1980
- Investigation of BaTiO3 and Gd2(MoO4)3 crystal surfaces by complementary AES and ISS techniquesApplications of Surface Science, 1980
- Magnitude of the atom shielding effect of oxygen in ion scattering spectrometry of magnesium silicate (forsterite)Journal of Vacuum Science and Technology, 1979
- A proposed physical model for the impregnated tungsten cathode based on Auger surface studies of the Ba-O-W systemApplications of Surface Science, 1979
- Oscillatory scattered ion yields from nonconductive materialsNuclear Instruments and Methods, 1978
- Fine features in ion scattering spectra (ISS)Applications of Surface Science, 1977
- Low energy ion scattering: Elastic and inelastic effectsNuclear Instruments and Methods, 1976
- On the poisoning of Co3O4 catalysts by alumina and magnesiaJournal of Catalysis, 1975