Multi-valued circuits in fault detection of binary logic circuits
- 1 January 1976
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 15, 25-33
- https://doi.org/10.1016/0026-2714(76)90616-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Application of Multithreshold Elements in the Realization of Many-Valued Logic NetworksIEEE Transactions on Computers, 1974
- Fault Detection of Binary Sequential Machines Using R-Valued Test MachinesIEEE Transactions on Computers, 1974
- An Efficient Algorithm for Generating Complete Test Sets for Combinational Logic CircuitsIEEE Transactions on Computers, 1971
- General Shift-Register Sequences of Arbitrary Cycle LengthIEEE Transactions on Computers, 1971
- Sequential Machines Capable of Fault DiagnosisIEEE Transactions on Computers, 1970
- Design of Sequential Machines with Fault-Detection CapabilitiesIEEE Transactions on Electronic Computers, 1967