NANOLEX: A FORTRAN program for accurate analysis of particle induced X-ray spectra
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 305-310
- https://doi.org/10.1016/0168-583x(84)90384-7
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Analytical functions for fitting peaks from Ge semiconductor detectorsNuclear Instruments and Methods, 1980
- Proton Microprobes and Particle-Induced X-Ray Analytical SystemsAnnual Review of Nuclear and Particle Science, 1980
- Proton induced x-ray emission analysis of Pima Indian autopsy tissuesAnalytical Chemistry, 1979
- Some aspects of detectors and electronics for X-ray fluorescence analysisNuclear Instruments and Methods, 1977
- Entrance Windows in Germanium Low-Energy X-Ray DetectorsIEEE Transactions on Nuclear Science, 1977
- A comparative study of techniques for quantitative analysis of the X‐ray spectra obtained with a Si(Li) detectorX-Ray Spectrometry, 1976
- Experimental K and L relative x-ray emission ratessAtomic Data and Nuclear Data Tables, 1974
- Exchange corrections ofx-ray emission ratesPhysical Review A, 1974
- Quantitative electron microprobe analysis using a lithium drifted silicon detectorX-Ray Spectrometry, 1973
- Level Structure of 171TmCanadian Journal of Physics, 1972