Effects of ionizing radiation on charge-coupled device structures
- 1 December 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 21 (6) , 193-200
- https://doi.org/10.1109/TNS.1974.6498927
Abstract
The effects of ionizing radiation on four different charge-coupled device structures have been investigated. Both shift registers and optical imaging devices have been considered. The electrical and imaging (where appropriate) performance of the devices were evaluated as a function of total gamma ray dose. The principal failure mechanisms have been identified for each particular device structure. Some conclusions about the relative radiation tolerance of the various device designs are drawn.Keywords
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