Surface tension measurement of molten silicon by the oscillating drop method using electromagnetic levitation
- 1 May 1995
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 151 (1-2) , 60-65
- https://doi.org/10.1016/0022-0248(95)00056-9
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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