Surface Characterization and Defect Detection by Analysis of Images Obtained with Coherent Light
- 31 December 1991
- journal article
- Published by Elsevier in CIRP Annals
- Vol. 40 (1) , 541-544
- https://doi.org/10.1016/s0007-8506(07)62049-6
Abstract
No abstract availableKeywords
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