Application of emission electron microscopy to the surface examination and topography of glasses with thin surface (Al, Cu, Au, Ni, Pt) metal films
- 30 September 1976
- journal article
- Published by Elsevier in Surface Technology
- Vol. 4 (5) , 473-483
- https://doi.org/10.1016/0376-4583(76)90060-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray measurement of the (111) surface relaxation in goldSurface Science, 1972
- On computer calculations of the structure and the energy of high angle grain boundaries in goldScripta Metallurgica, 1971
- Anwendung der Emissions-Elektronenmikroskopie in der Metallographie / The Use of the Emission Electron Microscope in MetallographyPractical Metallography, 1969
- III Surface Deterioration of Optical GlassesPublished by Elsevier ,1965