Diffusion in evaporated films of gold-aluminium

Abstract
Diffusion coefficients and activation energies for diffusion in successively evaporated films of gold and aluminium have been determined by observing the changes in reflectivity at the gold and aluminium surfaces on annealing. The changes were characteristic of a sharply defined reaction boundary rather than of a gradual change in concentration. The variations with film thickness showed that this was a phase boundary caused by the formation of the intermetallic compound Au2Al. The presence of this compound was confirmed by electron diffraction. Results indicated a vacancy diffusion mechanism rather than grain boundary diffusion.

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