Mapping of short-range adhesive forces by scanning tunneling microscopy
- 15 August 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 50 (7) , 5008-5011
- https://doi.org/10.1103/physrevb.50.5008
Abstract
Detection of short-range interactions in combination with tunneling microscopy provides a means for characterizing the chemical nature of surfaces. Results are presented that demonstrate that carbon adsorbed on a rough, polycrystalline Ir surface can be detected on an atomic level.This publication has 12 references indexed in Scilit:
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