Calculation and Measurement of Image Formation, Spatial Resolution, and Effective Depth of Focus for a Scanning Microscope with Confined Electromagnetic Waves
- 1 October 1986
- journal article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 33 (10) , 1279-1286
- https://doi.org/10.1080/713821878
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Microscopy and pattern generation with scanned evanescent wavesApplied Optics, 1984