Instrument-independent MS/MS Database for XQQ instruments - A kinetics-based measurement protocol
- 1 September 1989
- journal article
- research article
- Published by National Institute of Standards and Technology (NIST) in Journal of Research of the National Institute of Standards and Technology
- Vol. 94 (5) , 281-304
- https://doi.org/10.6028/jres.094.027
Abstract
A detailed kinetics-based measurement protocol is proposed for the development of a standardized MS/MS database for XQQ tandem mass spectrometers. The technical basis for the protocol is summarized. A CAD database format is proposed.Keywords
This publication has 3 references indexed in Scilit:
- Absolute cross-section measurements in XQQ instruments: Ar+ + N2 → Ar + N+2International Journal of Mass Spectrometry and Ion Processes, 1988
- Instrument-independent cad spectral databases: absolute cross-section measurements in QQQ instrumentsJournal of Research of the National Bureau of Standards, 1987
- Validation of absolute target thickness calibrations in a QQQ instrument by measuring absolute total cross-sections of Ne+ (Ne, Ne) Ne+International Journal of Mass Spectrometry and Ion Processes, 1986