Influence of surface treatment on electrical activity of dislocations and minority carrier diffusion length in cast multicrystalline silicon
- 1 May 1994
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 24 (1-3) , 74-77
- https://doi.org/10.1016/0921-5107(94)90301-8
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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