A laser direct write double-level-metal technology for rapid fabrication

Abstract
An all-dry, double-level-metal technology for personalization of VLSI gate arrays is described. The goal is to provide rapid prototyping of new electronic systems, and to serve as the nucleus for a potential job-shop, low-volume manufacturing environment. The process development is examined for the demonstration of double-level-metal interconnect, with emphasis on novel technologies such as the laser direct write and single-wafer metal etching using the magnetron-enhanced reactive-ion-etching technique. A double-level-metal interconnect based on 100000 laser patterned 2- mu m vias has been successfully demonstrated using this technology.

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