Circuit to facilitate the measurement by the four-probe method of the resistivity of silicon in the range 0.002 to 10 000 ohm cm
- 1 March 1962
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 39 (3) , 119-121
- https://doi.org/10.1088/0950-7671/39/3/307
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- An AC Bridge for Semiconductor Resistivity Measurements Using a Four-Point ProbeBell System Technical Journal, 1961