Time-of-Flight Measurement of Hole Mobility in Aluminum (III) Complexes
- 1 November 1999
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 38 (11A) , L1252-1254
- https://doi.org/10.1143/jjap.38.l1252
Abstract
We measured hole drift mobility in vacuum-deposited films of aluminum (III) complexes, tris (8-quinolinolato) aluminum (III) (Alq3), tris (8-phenanthridinolato) aluminum (III) (Alph3) and tris (4-methyl-8-quinolinolato) aluminum (III) (Almq3), using a time-of-flight technique. Hole transport was nondispersive for Alq3 and dispersive for Alph3 and Almq3. The hole mobilities of these aluminum complexes were of the order of 10-10–10-8 cm2/V·s and were largely dependent on the electric field.Keywords
This publication has 16 references indexed in Scilit:
- Schottky energy barriers and charge injection in metal/Alq/metal structuresApplied Physics Letters, 1999
- Fabrication of highly efficient organic electroluminescent devicesApplied Physics Letters, 1998
- Electrical properties of organic electroluminescent devices with aluminium alloy cathodeSynthetic Metals, 1997
- Electron and hole mobility in tris(8-hydroxyquinolinolato-N1,O8) aluminumApplied Physics Letters, 1995
- Electron transport in N,N′-bis(2-phenethyl)-perylene-3,4: 9,10-bis(dicarboximide)Journal of Applied Physics, 1993
- Transient behavior of organic thin film electroluminescenceApplied Physics Letters, 1992
- Electroluminescence of doped organic thin filmsJournal of Applied Physics, 1989
- An Analysis of the Dispersive Charge Transport in Vitreous 0.55 As2S3: 0.45 Sb2S3Physica Status Solidi (a), 1979
- Anomalous transit-time dispersion in amorphous solidsPhysical Review B, 1975
- Drift mobilities in amorphous charge-transfer complexes of trinitrofluorenone and poly-n-vinylcarbazoleJournal of Applied Physics, 1972