Comparative isotopic measurements on xenon and krypton
- 1 March 1996
- journal article
- other
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 153 (1) , L1-L5
- https://doi.org/10.1016/0168-1176(96)04368-6
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A three-ratio scheme for the measurement of isotopic ratios of siliconJournal of Research of the National Institute of Standards and Technology, 1993