A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy
- 1 October 1994
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 27 (5) , 762-766
- https://doi.org/10.1107/s0021889894002621
Abstract
With aid of a transmission-electron-microscope (TEM) double-tilt holder, a method for determining the normals to planar structures and their traces in a TEM is developed. This method is considered to be simple and convenient when compared with other methods. The accuracy of the method for the determination of both the normals to planar structures and their traces is within 2°.Keywords
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