Near-field photodetection optical microscopy (NPOM): a novel probe for optical characterization on a subwavelength spatial scale

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Abstract
Near-field Photodetection Optical Microscopy (NPOM) is a new approach to optical surface characterization with sub-wavelength spatial resolution. The technique is based upon the direct detection of local variations in optical intensity near a surface with a photodetector of nanometer size. The ultra-small photodetector probe is raster scanned in close proximity to an optically illuminated surface and the photoresponse of the probe is measured at each point. The local optical information is electronically stored and displayed by computer in a manner similar to all Scanning Probe Microscopies. The resultant image represents the local optical intensity at each point on the illuminated surface. The probe fabrication and a recent experimental demonstration of the probe capabilities will be described.

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