Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography
- 4 February 1966
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 151 (3710) , 562-568
- https://doi.org/10.1126/science.151.3710.562
Abstract
Solid-state devices developed primarily for nuclear gamma spectroscopy have many potential uses in x-ray analysis.Keywords
This publication has 5 references indexed in Scilit:
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- A Survey of the Applications and Limitations of Various Types of Detectors in Radiation Energy MeasurementIEEE Transactions on Nuclear Science, 1964
- A high resolution lithium-drift germanium gamma-ray spectrometerNuclear Instruments and Methods, 1964
- Gamma ray spectroscopy using a germanium lithium-drifted diodeNuclear Instruments and Methods, 1963
- Gamma-Ray Spectrum obtained with a Lithium-drifted p–i–n Junction in GermaniumNature, 1962