Breakdown in conventional and vacuum microelectronics field emission devices
- 24 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Determination of the Surface Tension and Surface Migration Constants for TungstenPhysical Review B, 1960
- The Field Emission Initiated Vacuum Arc. I. Experiments on Arc InitiationPhysical Review B, 1953