Scanning force microscopy of KI exposed to exciton-producing UV light
- 1 June 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 101 (1-2) , 122-126
- https://doi.org/10.1016/0168-583x(95)00069-0
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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- Atomic force microscopy of ultraviolet-induced surface erosion on potassium iodideRadiation Effects and Defects in Solids, 1994
- Defect formation and sputtering of alkali halides with low energy irradiationPhilosophical Magazine, 1971