Field emission from microtip test arrays using resistor stabilization

• 1 March 1995
• journal article
• Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
• Vol. 13  (2) , 474-477
• https://doi.org/10.1116/1.588336

Abstract

Keywords

• ROOM TEMPERATURE
• HIGH VOLTAGE
• WORK FUNCTION
• FIELD EMISSION