An Approach to Measure Ultrafast-Funneling-Current Transients

1 January 1986

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 33 (6) , 1651-1656
https://doi.org/10.1109/tns.1986.4334658

Abstract

Funneling-current transients are predicted to occur on a picosecond time scale. We have developed an advanced approach to measure picosecond single-event-upset currents in semiconductor devices with <40 ps time resolution. Our approach utilizes high-bandwidth sampling of repetitively-produced events. In this paper we describe the experimental approach and report characterization studies of the time resolution of the measurement components. We also report first measurements of picosecond single-event-current transients.

Keywords

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