The temperature stability of punch-through diodes
- 1 June 1978
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 21 (6) , 897-900
- https://doi.org/10.1016/0038-1101(78)90316-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A review of some charge transport properties of siliconSolid-State Electronics, 1977
- DIFFUSIVITY OF ELECTRONS AND HOLES IN SILICONApplied Physics Letters, 1969
- Carrier mobilities in silicon empirically related to doping and fieldProceedings of the IEEE, 1967