Quasielastic hot-electron transport in solid N2 films

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Abstract
Low‐energy (0–20 eV) electron transmission experiments on thin (0–6.5 nm) solid molecular nitrogen films deposited at 17 K on a platinum substrate are reported. A theoretical model, based upon surface scattering with various angular distributions and quasielastic isotropic bulk scattering, is described to analyze the results in the energy range 2.5–7 eV relative to vacuum. Electronic conduction‐band densities of states and electron scattering mean free paths are extracted by fitting the model to experimental data.