Noise margins for Josephson logic and memory devices
- 1 May 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 19 (3) , 1213-1216
- https://doi.org/10.1109/tmag.1983.1062340
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Thermally induced vortex-to-vortex transitions in a superconducting quantum interference deviceApplied Physics Letters, 1982
- Thermal noise induced switching of Josephson logic devicesApplied Physics Letters, 1982
- High-tolerance three-Josephson-junction curent-injection logic devices (HTCID)IEEE Transactions on Magnetics, 1981
- Calculation of threshold curves for Josephson quantum interference devicesIEEE Transactions on Magnetics, 1977
- Voltage Due to Thermal Noise in the dc Josephson EffectPhysical Review Letters, 1969