Determination of carrier lifetime from rectifier ramp recovery waveform
- 1 October 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 9 (10) , 553-555
- https://doi.org/10.1109/55.17842
Abstract
A charge-control analysis is used to obtain an expression relating the carrier lifetime to the realistic ramp recovery waveform of a p-i-n diode of arbitrary softness. The method is shown to produce a consistent lifetime for different values of forward currents, current ramp rates, and the resultant softness factors.Keywords
This publication has 3 references indexed in Scilit:
- A comparative study of methods of measuring carrier lifetime in p-i-n devicesIEEE Transactions on Electron Devices, 1980
- Measurement and analysis of carrier distribution and lifetime in fast switching power rectifiersIEEE Transactions on Electron Devices, 1980
- Correlations between reverse recovery time and lifetime of p-n junction driven by a current rampIEEE Transactions on Electron Devices, 1970