Raman Scattering in ZnTe

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Abstract
The Raman spectrum of ZnTe has been investigated. The fundamental frequencies have been found to be v̄LO=208.3±0.5 cm−1 and v̄TO= 177.5±0.5 cm−1. The temperature variation of v̄LO has been examined between room temperature and 4°K. The zone boundary frequencies at the critical points X, L, and W have been estimated from the second‐order Raman spectrum. In determining these frequencies a theoretical model was used to assist in the assignment of the frequencies and as a check on the consistency of the results. The values obtained were further checked using regularities previously observed in the phonon spectra of zinc‐blende semiconductors.