Sub-micron spatial resolution of a micro-XAFS electrostatic microscope with bending magnet radiation: Performance assessments and prospects for aberration correction
- 1 August 1994
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 347 (1-3) , 436-440
- https://doi.org/10.1016/0168-9002(94)91923-2
Abstract
No abstract availableKeywords
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