Near‐field mapping of surface polariton fields
- 1 May 2001
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 202 (2) , 313-319
- https://doi.org/10.1046/j.1365-2818.2001.00809.x
Abstract
Using the general approach to image formation in collection near‐field optical microscopy, I derive the symmetry relations for the amplitude coupling coefficients in the case of a weakly guiding single‐mode fibre terminated with a probe tip possessing axial symmetry. It is shown that, for the symmetrical detection configuration, six elements of the coupling matrix can be expressed by using only three independent coupling coefficients. The obtained relations are further applied to describe near‐field mapping of surface plasmon polariton (SPP) fields. I demonstrate that, for the symmetrical detection configuration, the near‐field optical image reflects the intensity distribution of the SPP field components parallel to the surface plane, even though the strong perpendicular component is also being detected. This conclusion is supported with numerical simulations that elucidate the influence of symmetry of the fibre probe on the resulting near‐field optical image. The near‐field optical images simulated for scattering systems typical for SPP microoptics and localization are presented. It is found that the presence of asymmetry in the detection configuration increases the contribution of the perpendicular field component and results in the images approaching the corresponding SPP intensity distributions.Keywords
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