Bilateral microscopy of dislocations and dislocation diodes in germanium
- 1 November 1968
- journal article
- Published by Springer Nature in Il Nuovo Cimento B (1971-1996)
- Vol. 58 (1) , 376-380
- https://doi.org/10.1007/bf02711811
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Preparation and analysis of germanium slices having prevalence of either screw or edge dislocationsIl Nuovo Cimento B (1971-1996), 1967
- The electrical properties of dislocations in semiconductorsAdvances in Physics, 1963
- Dislocations in the diamond latticeJournal of Physics and Chemistry of Solids, 1958
- Restoration of Resistivity and Lifetime in Heat Treated GermaniumJournal of Applied Physics, 1955