All-Dielectric High-Reflecting Layers
- 1 May 1954
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 44 (5) , 371-373
- https://doi.org/10.1364/josa.44.000371
Abstract
A simple method is described for calculating the effect of thickness errors in systems of multilayer dielectric films. The results of its application to systems of low-index—high-index quarter-wave pairs are given.Keywords
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