Quantitative PIXE microanalysis of fluid inclusions based on a layered yield model
- 1 March 1991
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 54 (1-3) , 292-297
- https://doi.org/10.1016/0168-583x(91)95528-l
Abstract
No abstract availableKeywords
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