Diffuse Phase Transition in Epitaxial BaTiO3 Thin Films
- 1 March 2002
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 17 (3) , 669-674
- https://doi.org/10.1557/jmr.2002.0095
Abstract
The thickness dependence of the dielectric properties of epitaxial BaTiO3 thin films was investigated for thicknesses ranging from 15 to 320 nm. The films were deposited by low-pressure metalorganic chemical vapor deposition on (100) MgO substrates. The relative dielectric permittivity and the loss tangent values decreased with decreasing thickness. High-temperature dielectric measurements showed that with decreasing film thickness, the ferroelectric-to-paraelectric transition temperature decreased, the relative dielectric permittivity decreased, and the phase transition was diffuse. The c/a ratio also decreased with decreasing film thickness. The observed behavior for epitaxial films of BaTiO3 was attributed to the presence of strain in the films.Keywords
This publication has 21 references indexed in Scilit:
- Dielectric properties of epitaxial BaTiO3 thin filmsApplied Physics Letters, 1998
- Variation of the Preferred Orientation with Thickness in Barium Titanate Thin Films Prepared by Pulsed Laser DepositionJapanese Journal of Applied Physics, 1997
- Size-induced diffuse phase transition in the nanocrystalline ferroelectricPhysical Review B, 1995
- Ferroelectric phase transition in BaTiO3 filmsJournal of Crystal Growth, 1995
- Antiferroelectric PbZrO3 thin films prepared by multi-ion-beam sputteringApplied Physics Letters, 1995
- Built-in electric field assisted nucleation and coercive fields in ferroelectric thin filmsIntegrated Ferroelectrics, 1994
- Dependence of the Crystal Structure on Particle Size in Barium TitanateJournal of the American Ceramic Society, 1989
- Critical exponents of the dielectric constants in diffused-phase-transition crystalsFerroelectrics Letters Section, 1982
- Pressure and Temperature Dependences of the Dielectric Properties of the Perovskites BaTiand SrTiPhysical Review B, 1966
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948