Angular dependence of the scattered ion yields in 4He+ → Cu scattering spectrometry
- 30 November 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 68, 108-117
- https://doi.org/10.1016/0039-6028(77)90195-9
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- A high-resolution energy analyser for surface studies by ion scattering spectrometry (ISSS)Journal of Physics E: Scientific Instruments, 1977
- Angular-dependent Ne+-ion scattering from a solid Au targetJournal of Vacuum Science and Technology, 1976
- Neutralisation behavior in scattering of low energy ions from solid surfacesNuclear Instruments and Methods, 1976
- Energy dependence of scattered ion yields in ISSJournal of Vacuum Science and Technology, 1976
- Oscillatory Cross Sections in Low-Energy Ion Scattering from SurfacesPhysical Review Letters, 1975
- Low energy ion scattering and Auger electron spectroscopy studies of clean nickel surfaces and adsorbed layersSurface Science, 1975
- Surface structure analysis by ion scatteringJournal of Vacuum Science and Technology, 1974
- Analysis of surface composition with low-energy backscattered ionsSurface Science, 1971
- Collisions of Ar+ ions with surface Cu atoms and charge exchange of scattered ions near the metal surfacePhysica, 1969
- Theory of Auger Ejection of Electrons from Metals by IonsPhysical Review B, 1954