A METHOD FOR SHARPENING FIM-SPECIMENS

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Abstract
A method is presented which makes it possible both to sharpen also extremely blunt specimens and to perform controlled back polishing without making the specimens blunter. The method seems to have quite general applications. It has been applied to such different materials as TiC-Ni-based and WC-Co-based cemented carbides, low alloyed and high alloyed steels, low alloyed zirconium and pure titanium

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