Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz
- 1 February 2000
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 71 (2) , 478-481
- https://doi.org/10.1063/1.1150227
Abstract
A quasioptical method is described that allows the determination of the complex dielectric constant almost continuously in the millimeter wave regime without the use of electrical contacts. The technique allows the dielectric properties of bulk samples (solids, powders, and liquids) and thin films (free standing or deposited on a substrate) to be measured with excellent absolute accuracy down to 2 K.Keywords
This publication has 3 references indexed in Scilit:
- Measurement of the complex dielectric constant down to helium temperatures. I. Reflection method from 1 MHz to 20 GHz using an open ended coaxial lineReview of Scientific Instruments, 2000
- Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductorsJournal of the Optical Society of America B, 1990
- Complex conductivity measurements between 26 and 110 GHz using complex impedance bridgesReview of Scientific Instruments, 1985