Void formation and electrical breakdown in epoxy resin

Abstract
The long term behaviour of epoxy resin subjected to high alternating electrical stress was studied using optical magnifications of up to 1500, a scanning electron microscope, and a high sensitivity discharge detector. The formation of voids in initially void-free specimens was investigated when voltages of duration between ten seconds and several thousand hours were applied using a pin-plane configuration. Defects in epoxy resins, mechanisms of their electrical aging, and their long term dielectric strength are discussed in relation to the phenomenon of void growth.

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