Void formation and electrical breakdown in epoxy resin
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Apparatus and Systems
- Vol. 96 (1) , 198-207
- https://doi.org/10.1109/t-pas.1977.32324
Abstract
The long term behaviour of epoxy resin subjected to high alternating electrical stress was studied using optical magnifications of up to 1500, a scanning electron microscope, and a high sensitivity discharge detector. The formation of voids in initially void-free specimens was investigated when voltages of duration between ten seconds and several thousand hours were applied using a pin-plane configuration. Defects in epoxy resins, mechanisms of their electrical aging, and their long term dielectric strength are discussed in relation to the phenomenon of void growth.Keywords
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