Reevaluation of thep(2×2)S/Cu(001) structure using angle-resolved photoemission extended fine-structure spectroscopy

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Abstract
We have performed low-temperature (110–160 K) angle-resolved photoemission extended-fine-structure studies of p(2×2)S/Cu(001). Analysis based on multiple-scattering spherical-wave calculations indicates that S adsorbs into a fourfold hollow site 1.32 Å above the Cu surface, with near-surface reconstruction of the Cu layers in general similar to recent low-energy-electron-diffraction and medium-energy-ion scattering results, removing an earlier discrepancy. The S-Cu bond length is determined to be 2.26 Å. The second-layer Cu(001) plane appears to be corrugated more than indicated by the other methods. Additional reconstruction may be present in this system.