The uniqueness of orientation determination by selected area electron diffraction

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Abstract
The orientation of a single crystal determined from a transmission electron diffraction pattern containing reflections from only one zone is in general not unique. It is shown that this ambiguity may be removed by taking into account the intensity distribution of the diffraction spots, provided that the diffraction pattern contains at least one reflection from a second zone. The method is illustrated on a particular example, and the results are verified by comparison with an x-ray Kossel line pattern taken in the electron microscope from the same specimen before thinning. The analysis of spot intensities allows the orientation to be determined to within ±2°, without the use of Kikuchi lines or structural features in the specimen.