Group Testing To Eliminate Efficiently All Defectives in a Binomial Sample
- 1 September 1959
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 38 (5) , 1179-1252
- https://doi.org/10.1002/j.1538-7305.1959.tb03914.x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- On the Detection of Defective Members of Large PopulationsThe Annals of Mathematical Statistics, 1957
- The Detection of Defective Members of Large PopulationsThe Annals of Mathematical Statistics, 1943