Surface reflectance spectroscopy: Its application to the study of very thin films
- 1 March 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 125 (1-2) , 129-142
- https://doi.org/10.1016/0040-6090(85)90406-7
Abstract
No abstract availableThis publication has 40 references indexed in Scilit:
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