Specimen holder design for X‐ray microanalysis of thin films in the TEM: reduction of spurious X‐rays
- 1 June 1984
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 134 (3) , 281-289
- https://doi.org/10.1111/j.1365-2818.1984.tb02521.x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Optimizing thin film X‐ray spectra for quantitative analysisJournal of Microscopy, 1982
- Application of scanning electron microscopy to x-ray analysis of frozen-hydrated sections. I. Specimen handling techniques.The Journal of cell biology, 1981
- A modified specimen stage for X-ray analysis in a TEMJournal of Physics E: Scientific Instruments, 1976
- Use of pure carbon specimen holders for analytical electron microscopy of thin sectionsUltramicroscopy, 1976
- The preparation, examination and analysis of frozen hydrated tissue sections by scanning transmission electron microscopy and X‐ray microanalysisJournal of Microscopy, 1975
- Specimen holder for energy dispersive x-ray analysis in the transmission electron microscopeReview of Scientific Instruments, 1975