High-Resolution TOF Secondary Ion Mass Spectrometer
- 1 January 1986
- book chapter
- Published by Springer Nature in Springer Proceedings in Physics
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A time-of-flight mass spectrometer for static SIMS applicationsJournal of Vacuum Science & Technology A, 1985
- Ion optics for time-of-flight mass spectrometers with multiple symmetryInternational Journal of Mass Spectrometry and Ion Processes, 1985
- Secondary ion mass spectrometry of biomolecules in the pico‐ and femto‐mol rangeJournal of Mass Spectrometry, 1984
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972